微電子機(jī)械系統(tǒng)和使用方法
【專利說明】
[0001] 相關(guān)申請的交叉參考
[0002] 本申請是2012年6月13日提交的第61/659, 179號、2012年11月8日提交的 第61/723, 927號、2012年11月9日提交的第61/724, 325號、2012年11月9日提交的第 61/724, 400號、2012年11月9日提交的第61/724, 482號和2012年6月13日提交的第 61/659, 068號美國臨時專利申請的非臨時申請并且要求所述美國臨時專利申請的優(yōu)先權(quán), 每個美國臨時專利申請的整體通過引用結(jié)合到本文中。
技術(shù)領(lǐng)域
[0003] 本申請涉及微電子機(jī)械系統(tǒng)(MEMS)和納米電子機(jī)械系統(tǒng)(NEMS)。
【背景技術(shù)】
[0004] 一般在硅(Si)和絕緣體上硅(SOI)晶片上加工微電子機(jī)械系統(tǒng)(MEMS),非常像標(biāo) 準(zhǔn)的集成電路那樣。然而MEMS裝置包括晶片上的移動部分以及電部件。MEMS裝置的示例 包括回轉(zhuǎn)儀、加速儀和麥克風(fēng)。MEMS裝置還能夠包括執(zhí)行器,執(zhí)行器移動以在對象上施加 力。示例包括微機(jī)器人操縱器。然而,當(dāng)加工MEMS裝置時,所加工的結(jié)構(gòu)的尺寸經(jīng)常不匹 配在布局中指定的尺寸。這能夠由例如不足的蝕刻或過度的蝕刻引起。
[0005] 對以下文獻(xiàn)進(jìn)行引用:
[0006] [A1]D. H. Titterton,J. L. Weston,"捷聯(lián)慣性導(dǎo)航技術(shù)(Strapdown Inertial Navigation Technology),'Peter Peregrinus Ltd. UK, 1997.
[0007] [A2]Y. Yazdi,F(xiàn). Ayazi,K. Najafi,"微機(jī)械慣性傳感器(Micromachined inertial sensors)Proceedings of the IEEE, vol. 86, no. 8, pp. 1640-1659,1998.
[0008] [A3] I. Skog, P. HSndel. "對 MEMS 慣性測量單元的校準(zhǔn)(Calibration of a MEMS inertial measurement unit) ^XVII IMEKO WORLD CONGRESS Metrology for a Sustainable Development, September,17-22,2006.
[0009] [A4] I. Skog. P. Handel "用于慣性導(dǎo)航的多用途的基于PC的平臺(A Versatile PC-Based Platform for Inertial Navigation)y,, in Proc. NORSIG 2006, Nordic Signal Processing Symposium, pp. 262-265, June. 2006.
[0010] [A5]A.Kim,M.F Golnaraghi,"使用光學(xué)位置跟蹤系統(tǒng)的慣性測量單元的初始 校準(zhǔn)(Initial calibration of an inertial measurement unit using an optical position tracking system)",in Proc. PLANS 2004, IEEE Position Location and Navigation Symposium, pp.96-101, April.2004.
[0011] [A6]R M. Rogers,"在集成導(dǎo)航系統(tǒng)中的應(yīng)用數(shù)學(xué)(Applied Mathematics In integrated Navigation Systems)" Second Edition. AIAA Education Series,2003.
[0012] [A7] F. Li and J. Clark,"MEMS的剛度、位移和梳齒驅(qū)動器力的實際測量 (Practical measurements of stiffness, displacement, and comb drive force ofMEMS) "IEEE UGIM,2010.
[0013] [A8]A.Shkel,C.Acar. "用于改善魯棒性的MEMS振動回轉(zhuǎn)儀結(jié)構(gòu)方法(MEMS Vibratory Gyroscopes Struetural Approaches to Improve Robustness),'Springer Verlag,2008.
[0014] [A9]Tang W C. "用于諧振傳感器和執(zhí)行器應(yīng)用的靜電梳齒驅(qū)動器 (Electrostatic comb drive for resonant sensor and actuator applications),'PhD Dissertation,University of California,Berkeley,CA. 1990.
[0015] [All] AD7746 電容到數(shù)字轉(zhuǎn)換器(Capacitance-to-Digital Convertor),模擬裝 置(Analog Devices),MA,2011.
[0016] 還對以下文獻(xiàn)進(jìn)行引用:
[0017] [BI]Udrea,F(xiàn).,Santra,S.,and Gardner,J. W.,2008, "CMOS 溫度傳感器-構(gòu) 思、本領(lǐng)域狀態(tài)和前景(CMOS Temperature Sensors-Concepts,State-of-the-art and Prospects) ",IEEE Semiconductor Conference,1pp. 31-40.
[0018] [B2]Webb,C.,1997, "紅外線:更快、更小、更便宜(Infrared :Faster,Smaller, Cheaper),'Control Instrumentation 44.
[0019] [B3]Childs,P. R. N.,Greenwood,J. R. and Long,C. A.,2000, "溫度測量的回顧 (Review of Temperature Measurement)", Review of Scientific Instruments,71(8) pp. 2959-2978.
[0020] [B4]Preston_Thomas,H.,1990, " 1990 的國際溫標(biāo)(ITS-90) (The International Temperature Scale of 1990 (ITS-90))",Metrologia 27,pp.186-193.
[0021] [B5]Hutter,J. L,and Bechhoefer,J.,1993, "原子力顯微鏡針尖的校準(zhǔn) (Calibration of atomic-force microscope tips)^Review of Scientific Instruments 64 (7),pp. 1868-1873.
[0022] [B6]Matei,G. A.,Thoreson,E. J.,Pratt,J. R.,Newell,D. B. and Bumham,N. A., 2006,"原子力顯微鏡懸臂的熱校準(zhǔn)的準(zhǔn)確度和精度(Precision and accuracy ofthermal calibration of atomic force microscopy cantilevers),'Review of Scientific Instruments77(8), pp. 1-6.
[0023] [B7]Press,W. H.,F(xiàn)lannery,B. P.,Teukolsky,S. A. and Vetterling,W. T.,1989, "FORTRAN的數(shù)值算法(Numerical Recipes in FORTRAN)",Cambridge University Press, Cambridge, Chap. 12.
[0024] [B8] Stark,R. W.,Drobek,T.,and Heckl,W. M.,2001,"用于原子力顯微鏡的自由 V 形懸臂的熱機(jī)械噪聲(Thermomechanical Noise of a Free V-Shaped Cantilever for Atomic Force Microscopy)Ultramicroscopy, 86, pp. 201-215.
[0025] [B9]Butt,H. J.,and Jaschke,M.,1995, "原子力顯微鏡中的熱噪聲的計算 (Calculation of Thermal Noise in Atomic Force Microscopy)", Nanotechnology, 6(l),pp. 1-7.
[0026] [B10]Levy,R.,and Maaloum,M.,2002,"測量原子力顯微鏡懸臂的彈簧常量: 熱漲落和其他方法(Measuring the Spring Constant of Atomic Force Microscope Cantilevers !Thermal Fluctuations and Other Methods)",Nanotechnology,13(I), pp. 34-37.
[0027] [Bll]Jayich,A.C.,and Shanks,W.E.,2008, "1 開爾文下的懸臂上采樣系統(tǒng) 的噪聲測溫法和電子測溫法(Noise Thermometry and Electron Thermometry of a Sample-On-Cantilever System Below IKelvin)",Applied Physics Letters,92 (I), pp. 1-3.
[0028] [B12]Li,F(xiàn).,and Clark,J. V.,2010,"MEMS的剛度、位移和梳齒驅(qū)動器力的實際 測量(Practical Measurements of Stiffness,Displacement,and Comb Drive Force of MEMS) ",EEE UGIM(University Government Industry Micro/nano)Symposium,pp. 1-6.
[0029] [B15]C0MS0L, Inc. 744Cowper Street, Palo Alto, CA 94301, USA, www. comsol. com
[0030] 還對以下文獻(xiàn)進(jìn)行引用:
[0031] [Cl]Gabrielson,T. B.,1993, "微機(jī)械聲學(xué)和振動傳感器中的機(jī)械熱噪聲 (Mechanical-Th